◆Commercialized atomic force microscope for combined mobile scanning of probes and samples;

◆Adopting a three-axis independent closed-loop piezoelectric translation scanning stage to achieve large-scale high-precision scanning;

◆Three axis independent scanning,XYZNot affecting each other, very suitable for 3D material and morphology detection;

◆Electric control sample moving table and lifting table, programmable multi-point position for fast and automated detection;

◆Longmen style scanning head design, marble base, vacuum adsorption and magnetic adsorption stage;
◆Intelligent needle insertion method for automatic detection of pressurized ceramic by motor control, protecting probes and samples;
◆High magnification assisted optical microscopy positioning, real-time observation and positioning of probes and sample scanning areas;

◆The closed-loop piezoelectric scanning table does not require nonlinear correction, and its nano characterization and measurement accuracy are superior to99.5%.

technical parameter